(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
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| Number of channels | 2 |
| Total supply voltage (+5 V = 5, ±5 V = 10) (min) (V) | 2.5 |
| Total supply voltage (+5 V = 5, ±5 V = 10) (max) (V) | 6 |
| Iout (typ) (A) | 0.32 |
| GBW (typ) (MHz) | 2.7 |
| Slew rate (typ) (V/µs) | 1.57 |
| Vos (offset voltage at 25°C) (max) (mV) | 3.5 |
| Offset drift (typ) (V/°C) | 0.000003 |
| Iq per channel (typ) (mA) | 0.7 |
| Features | Shutdown |
| Rating | HiRel Enhanced Product |
| Operating temperature range (°C) | -55 to 125 |
| Input bias current (max) (pA) | 25 |
| CMRR (typ) (dB) | 68 |
| Rail-to-rail | In to V-, Out |
| Architecture | CMOS |