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SN74HC02-EP Texas instruments

SN74HC02-EP
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SN74HC02-EP
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The SN74HC02 contains four independent 2-input NOR gates. It performs the Boolean function Y = (A + B)\ or Y = A\ • B\ in positive logic.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of Up To –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • 2-V to 6-V VCC Operation
  • Outputs Can Drive Up To 10 LSTTL Loads
  • Low Power Consumption, 20-µA Max ICC
  • Typical tpd = 8 ns
  • ±4-mA Output Drive at 5 V
  • Low Input Current of 1 µA Max

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Technology family HC
Number of channels 4
Supply voltage (min) (V) 2
Supply voltage (max) (V) 6
Inputs per channel 2
IOL (max) (mA) 4
IOH (max) (mA) -4
Output type Push-Pull
Input type Standard CMOS
Features High speed (tpd 10- 50ns)
Data rate (max) (MBits) 28
Rating HiRel Enhanced Product
Operating temperature range (°C) -40 to 125
SN74HC02-EP