SN74AHC02-EP Texas instruments

SN74AHC02-EP

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SN74AHC02-EP

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Описание

The AHC02 device contains four independent 2-input NOR gates that perform the Boolean function Y = A\ B\ or Y = (A + B)\ in positive logic.

Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of –55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree
Operating Range 2-V to 5.5-V V_CC
Latch-Up Performance Exceeds 250 mA Per JESD 17
ESD Protection Exceeds JESD 22
- 2000-V Human-Body Model (A114-A)
- 200-V Machine Model (A115-A)
- 1000-V Charged-Device Model (C101)

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Technology family	AHC
Number of channels	4
Supply voltage (min) (V)	2
Supply voltage (max) (V)	5.5
Inputs per channel	2
IOL (max) (mA)	50
IOH (max) (mA)	-50
Output type	Push-Pull
Input type	Standard CMOS
Features	Over-voltage tolerant inputs, Very high speed (tpd 5-10ns)
Data rate (max) (MBits)	110
Rating	HiRel Enhanced Product
Operating temperature range (°C)	-55 to 125