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CD4011UB-MIL Texas instruments

CD4011UB-MIL
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CD4011UB-MIL
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CD4011UB quad 2-input NAND gate provides the system designer with direct implementation of the NAND function and supplements the existing family of CMOS gates. The CD4011UB types are supplied in 14-lead hermetic dual-in-line ceramic packages (F3A suffix), 14-lead dual-in-line plastic packages (E suffix), 14-lead small-outline package (M, MT, M96, NSR suffixes), and 14-lead thin shrink small-outline packages (PW and PWR suffixes).
  • Propagation delay time = 30 ns (typ). at CL = 50 pF, VDD = 10 V
  • Standardized symmetrical output characteristics
  • 100% tested for quiescent current at 20V
  • Maximum input current of 1 µA at 18 V over full package temperature range; 100nA at 18 V and 25°C
  • 5-V, 10-V, and 15-V parametric ratings
  • Meets all requirements of JEDEC Tentative Standard No. 13B "Standard Specifications for Description of ’B’ Series CMOS Devices"

Data sheet acquired from Harris Semiconductor

Technology family CD4000
Supply voltage (min) (V) 3
Supply voltage (max) (V) 18
Number of channels 4
Inputs per channel 2
IOL (max) (mA) 1.5
IOH (max) (mA) -1.5
Input type Standard CMOS
Output type Push-Pull
Features High speed (tpd 10- 50ns)
Data rate (max) (MBits) 8
Rating Military
Operating temperature range (°C) -55 to 125
CD4011UB-MIL