AFE1256 Texas instruments

AFE1256

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AFE1256

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Описание

The AFE1256 is a 256-channel, analog front-end (AFE) designed to suit the requirements of flat-panel detectors (FPDs) based on digital X-ray systems. The device includes 256 integrators, a programmable gain amplifier (PGA) for full-scale, charge-level selection, a correlated double sampler (CDS) with dual banking, 256:4 analog multiplexers, and four 16-bit, successive-approximation register (SAR) analog-to-digital converters (ADCs) onboard. Serial data from the ADCs are available in SPI™ format. Hardware-selectable integration polarity allows for the integration of positive or negative charge and provides more flexibility in system design. The Nap feature enables substantial power saving. This power savings is especially useful in battery-powered systems. The device is available as a 22-mm × 5-mm gold-bumped die and a 38-mm × 28-mm, COF-314 TDS package in singulated forms. To request a full data sheet or other design resources: request AFE1256

256 Channels
On-Chip, 16-Bit ADC
Photodiode Short Immunity
Column Short Immunity
High Performance:
- Noise: 758 e-RMS with 28-pF Sensor
  Capacitor in 1.2-pC Range
- Integral Nonlinearity:
  ±2 LSB with Internal 16-Bit ADC
- Minimum Scan Time:
  - 37.9 µs in Normal Mode
  - 20 µs in 2x Binning Mode
Integration:
- Eight Selectable Full-Scale Ranges:
  0.15 pC (Min) to 9.6 pC (Max)
- Built-In Correlated Double Sampler
- 2x Binning (Averages Charge of Two Adjacent
  Channels) for Faster Throughput
- Pipelined Integrate and Read: Allows Data
  Read During Integration
Flexibility:
- Electron and Hole Integration
Low Power:
- 2.9 mW/Ch with ADC
- 2.3 mW/Ch without ADC
- 0.1 mW/Ch in Nap Mode
- Total Power-Down Feature
22-mm × 5-mm Gold-Bump Die,
Suitable for TCP and COF

Application

Flat-Panel, X-Ray Detector

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Product type	Sensors
Die or wafer type	Tested Die
Rating	Catalog
Operating temperature range (°C)	0 to 70